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S

Series in Microelectronics

edited by Wolfgang Fichtner
Qiuting Huang
Heinz Jäckel
Hans Melchior
George S. Moschytz
Gerhard Tröster

Vol. 111

Mauro P. M. Ciappa

Some Reliability Aspects

of IGBT Modules

for High-Power Applications

2001. X, 178 pages. € 49,90

ISBN 3-89649-657-3

Abstract:

The assurance that a technical system will perform its intended function for the required duration and within a given environment requires a variety of engineering activities to be performed, which start from the project definition and continue during the whole life cycle. In the case of non-repairable systems this task is accomplished essentially by concurrent interdisciplinary efforts with the scope to contribute to the system architecture design, to select materials, processes, and components, as well to validate the selections made by means of tests, modeling, and analysis.

Present work deals with some aspects related to the reliability physics of Insulated Gate Bipolar Transistors (lGBT) for high power applications and it is organized in three main thematic sections.

Series in Microelectronics

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